ČSN EN 1330-4 (zruš.) - Nedestruktivní zkoušení - Terminologie - Část 4: Termíny používané při zkoušení ultrazvukem
| Stáhnout normu: | ČSN EN 1330-4 (zruš.) (Zobrazit podrobnosti) Zákazníci, kteří mají na svém počítači sjednanou od České agentury pro standardizaci (ČAS) službu ČSN on-line pro elektronický přístup do plných textů norem v pdf (verzi pro firmy nebo pro jednotlivce), mohou zde přímo otevírat citované ČSN. |
| Datum vydání/vložení: | 2010-07-01 |
| Třidící znak: | 015005 |
| ICS: |
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| Stav: | Neplatná |
- 2.1.1 frequency
- 2.1.2 cut-off frequency
- 2.1.3 nominal frequency
- 2.1.4 test frequency
- 2.1.5 frequency spectrum
- 2.1.6 centre frequency
- 2.1.7 peak frequency
- 2.1.8 bandwidth
- 2.1.9 relative bandwidth
- 2.2.1 wave
- 2.2.2 wavefront
- 2.2.3 wavelength
- 2.2.4 amplitude
- 2.2.5 phase
- 2.2.6 wave train
- 2.2.7 continuous wave
- 2.2.8 stationary wave
- 2.2.9 pulse
- 2.2.10 pulse amplitude
- 2.2.11 pulse energy
- 2.2.12 pulse shape
- 2.2.13 pulse envelope
- 2.2.14 pulse duration
- 2.2.15 pulse repetition frequency
- 2.2.16 broad band pulse
- 2.2.17 narrow band pulse
- 2.2.18 medium band pulse
- 2.2.19 pulse reverberation
- 2.2.20 pulse rise time
- 2.2.21 pulse spectrum
- 2.2.22 time of flight
- 2.3.1 longitudinal wave compressional wave
- 2.3.2 plate wave
- 2.3.3 Rayleigh wave
- 2.3.4 tranverse wave
- 2.3.5 creeping wave
- 2.3.6 cylindrical wave
- 2.3.7 spherical wave
- 2.3.8 plane wave
- 3.1.1 ultrasonic wave
- 3.1.2 transducer
- 3.1.3 piezo-electrical transducer
- 3.1.4 X-cut crystal
- 3.1.5 Y-cut crystal
- 3.1.6 focusing transducer
- 3.1.7 electromagnetic-acoustic transducer
- 3.1.8 magnetostrictive transducer
- 3.2.1 phase velocity
- 3.2.2 near field
- 3.2.3 far field
- 3.2.4 group velocity
- 3.2.5 focal zone
- 3.2.6 focus focal point
- 3.2.7 wave interference
- 3.2.8 sound field
- 3.2.9 sound velocity
- 3.2.10 sound beam
- 3.2.11 beam axis
- 3.2.12 beam profile
- 3.2.13 divergence angle
- 3.2.14 beam edge
- 3.2.15 acoustical properties
- 3.2.16 anisotropic material
- 3.2.17 beam divergence
- 3.2.18 beam steering
- 3.2.19 beam width
- 3.2.20 focal distance
- 3.2.21 focal length
- 3.2.22 focal width
- 3.3.1 sound attenuation
- 3.3.2 attenuation coefficient
- 3.3.3 acoustical impedance
- 3.3.4 absorption
- 3.3.5 absorption coefficient
- 3.3.6 scattered energy
- 3.4.1 interface
- 3.4.2 refraction
- 3.4.3 refractive index
- 3.4.4 angle of refraction
- 3.4.5 angle of incidence
- 3.4.6 critical angle
- 3.4.7 reflection
- 3.4.8 corner reflector
- 3.4.9 edge effect
- 3.4.10 beam displacement due to reflection
- 3.4.11 reflection coefficient
- 3.4.12 angle of reflection
- 3.4.13 total reflection
- 3.4.14 mode conversion
- 3.4.15 acoustic shadow
- 3.4.16 transmission coefficient
- 3.4.17 beam angle
- 3.4.18 composite material
- 3.4.19 probe angle
- 3.4.20 probe frequency
- 4.1.1 probe
- 4.1.2 single transducer probe
- 4.1.3 focussing probe
- 4.1.4 transducer array probe
- 4.1.5 straight beam probe
- 4.1.6 surface wave probe
- 4.1.7 longitudinal wave probe
- 4.1.8 wheel probe
- 4.1.9 transverse wave probe
- 4.1.10 dual-element probe
- 4.1.11 contoured probe
- 4.1.12.1 angle probe
- 4.1.12.2 angle-beam probe
- 4.1.12.3 variable angle probe
- 4.1.13 probe axis
- 4.1.14 squint angle
- 4.1.15 probe index point
- 4.1.16 nominal angle of probe
- 4.1.17 refracting prism
- 4.1.18 transducer backing
- 4.1.19 damping capacity (of transducer backing)
- 4.1.20 probe damping factor
- 4.1.21 delay path
- 4.1.22 effective transducer size
- 4.1.23 transducer mosaic
- 4.1.24 probe shoe
- 4.1.25 wear plate
- 4.1.26 roof angle
- 4.1.27 convergence zone
- 4.1.28 convergence distance
- 4.1.29 phased array probe
- 4.1.30 element size
- 4.1.31 piezoelectric composite transducer
- 4.1.32 delay line
- 4.2.1 test equipment
- 4.2.2 ultrasonic instrument
- 4.2.3 distance-amplitude compensation
- 4.2.4 dead zone
- 4.2.5 detection equipment sensitivity
- 4.2.6 delayed time-base sweep
- 4.2.7 gain adjustment
- 4.2.8 dynamic range
- 4.2.9.1 lateral resolution
- 4.2.9.2 axial resolution
- 4.2.10 suppression grass cutting
- 4.2.11 time base
- 4.2.12 time base range
- 4.2.13 time base adjustment
- 4.2.14 gate
- 4.2.15 monitor
- 4.2.16 gate level
- 4.2.17 amplifier
- 4.2.18 amplifier, linear
- 4.2.19 amplifier, logarithmic
- 4.2.20 analogue-to-digital converter
- 4.2.21 attenuator
- 4.2.22 digitisationerror
- 4.2.23 transmitter pulse
- 4.2.24 proportional output
- 4.2.25 proportional gate
- 4.2.26 receiver
- 4.2.27 transmitter
- 4.2.28 ultrasonic testing system
- 4.2.29 ultrasound electronics
- 4.2.30 waveform display
- 4.3.1 calibration block
- 4.3.2 reference block
- 4.3.3 reference echo
- 4.3.4 test block
- 5.1.1 multiple-echo technique
- 5.1.2 through transmission technique
- 5.1.3 immersion technique
- 5.1.4 pulse echo technique
- 5.1.5 time-of-flight technique
- 5.1.6 scanning
- 5.1.7 direct scan
- 5.1.8 indirect scan
- 5.1.9 multiple transverse technique
- 5.1.9.1 V-transmission
- 5.1.9.2 W-transmission
- 5.1.10 single probe technique
- 5.1.11 double probe technique
- 5.1.12 tandem technique
- 5.1.13 contact testing technique
- 5.1.14 gap testing technique
- 5.1.15 couplant path
- 5.1.16 orbital scanning
- 5.1.17 swivel scanning
- 5.1.18 spiral scanning
- 5.1.19 manual scanning
- 5.1.20 automated scanning
- 5.1.21 sizing technique
- 5.1.22 acoustical holography
- 5.1.23 acoustical imaging
- 5.1.24 acoustical tomography
- 5.1.25 angle beam scanning
- 5.1.26 automated ultrasonic testing
- 5.1.27 automated ultrasonic testing system
- 5.1.28 data logging
- 5.1.29 data reduction
- 5.1.30 flank-to-flank measurement
- 5.1.31 flow-chart procedure
- 5.1.32 measurement modes
- 5.1.33 oblique incidence
- 5.1.34 peak-to-peak measurement
- 5.1.35 straight beam scanning
- 5.2.1 scanning surface
- 5.2.2 examination volume
- 5.2.3 scanning direction
- 5.2.4 probe orientation
- 5.2.5 point of incidence
- 5.2.6 echo receiving point
- 5.2.7 coverage of testing
- 5.2.8 quality leve
- 5.3.1 acoustical impedance matching
- 5.3.2 couplant
- 5.3.3 transfer correction
- 5.3.4 coupling losses
- 5.3.5 coupling techniques
- 5.4.1 reflector
- 5.4.2 reference reflector
- 5.5.1 transmission pulse indication
- 5.5.2 echo
- 5.5.3 back-wall echo
- 5.5.4 echo width
- 5.5.5 echo height
- 5.5.6 discontinuity echo
- 5.5.7 spurious echo
- 5.5.8.1 cross-talk (probe)
- 5.5.8.2 cross-talk (instrument)
- 5.5.9 multiple echo
- 5.5.10 interface echo
- 5.5.11 ghost echo
- 5.5.12 noise
- 5.5.13 signal-to-noise ratio
- 5.5.14 transmission point
- 5.5.15 expanded time-base sweep
- 5.5.16 A-scan presentation
- 5.5.17 B-scan presentation
- 5.5.18 C-scan image
- 5.5.19 D-scan presentation
- 5.5.20 F-scan presentation
- 5.5.21 volume scan presentation
- 5.5.22 P-scan presentation
- 5.5.23 R.F. signal
- 5.5.24 rectified signal
- 5.5.25 display response
- 5.5.26 echo pattern
- 5.5.27 echo dynamic pattern
- 5.5.28 echo static pattern
- 5.5.29 indication
- 5.5.30 linearity of time base
- 5.5.31 linearity, horizontal
- 5.5.32 linearity, vertical
- 5.5.33 noise level
- 5.5.34 zero crossing
- 5.6.1 sound path length
- 5.6.2 sound path travel distance
- 5.6.3 sound path travel time
- 5.6.4 skip distance
- 5.6.5 reflector depth
- 5.7.1 defect size assessment
- 5.7.2 reflectivity
- 5.7.3 directional reflectivity
- 5.7.4.1 DGS-diagram
- 5.7.4.2 DGS-method
- 5.7.5.1 distance amplitude correction curve DAC
- 5.7.5.2 DAC-method
- 5.7.6 reference block method
- 5.7.7 half-amplitude technique
- 5.7.8 reference level
- 5.7.9 acceptance level
- 5.7.10 reporting level
- 5.7.11 testing level
- 5.7.12 display level
- 5.7.13 evaluation level
- 5.7.14 characterisation of an indication
- 5.7.15 classification of an indication
- 5.7.16 cluster of indications
- 5.7.17 combined length of indications
- 5.7.18 synthetic aperture focusing technique (SAFT)
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Nahlásit chybu
5.5.12 noise
randomly distributed signals in the screen image, due to reflections from the structure of the material or the electronics
5.5.12 indikace od šumu
náhodně rozložené signály na obrazovce, způsobené odrazy od struktury materiálu nebo elektronikou