Nacházíte se: Domů » Terminologická databáze » ČSN EN ISO 10360-1 - probing system qualification

ČSN EN ISO 10360-1 - Geometrické požadavky na výrobky (GPS) - Přejímací a periodické zkoušky souřadnicových měřicích strojů (CMM) - Část 1: Slovník

Stáhnout normu:

ČSN EN ISO 10360-1 (Zobrazit podrobnosti)

Změny:

OPRAVA 1 | Datum vydání/vložení: 2003-09-01

Datum vydání/vložení:

2003-09-01

Zdroj:

https://www.iso.org/obp/ui/#iso:std:iso:10360:-1:ed-1:v1:en

Třidící znak:

252011

Obor:

Souřadnicové měřící stroje

ICS:

01.040.17 - Metrologie a měření. Fyzikální jevy (názvosloví)
17.040.30 - Přístroje pro měření délky a úhlu

Stav:

Platná

2 coordinate measuring machine CMM
2.2 coordinate measurement
2.3 measuring volume
2.4 workpiece coordinate system
2.5 machine coordinate system
2.7 probing (to probe),
2.8 discrete-point probing
2.9 scanning
2.10 program point
2.11 intermediate point
2.12 indicated measured point
2.13 corrected measured point
2.14 target contact point
2.15 actual contact point
2.16 tip correction vector
2.17 acceptance test (of a CMM)
2.18 reverification test (of a CMM)
2.19 interim check (of a CMM)
2.20 Gaussian radial distance
2.21 range
2.22 hysteresis
2.23 ram
3 Terms relating to the probing system
3.1 probe
3.2 contacting probing system
3.3 non-contacting probing system
3.4 optical probing system
3.5 multi-probe system
3.6 articulating probing system
3.7 probing system qualification
3.8 multiple styli
4 Terms relating to the stylus system
4.1 stylus
4.2 stylus tip
4.3 stylus system components
4.4 stylus system
4.5 stylus length
4.6 stylus tip offset
5 Terms relating to the rotary table
5.1 rotary table
5.2 rotary table setup
6 Terms relating to the operation of the CMM
6.1 discrete-point probing speed
6.2 scanning speed
6.3 back off distance
7 Terms relating to scanning
7.1 corrected scan point
7.2 target scan line
7.3 corrected scan line
7.4 target scan plane
7.5 pre-defined path scanning
7.6 not pre-defined path scanning
7.7 scan sequence
7.8 high point density (of a CMM)
7.9 low point density (of a CMM)
8 Terms relating to artefacts
8.1 material standard
8.2 material standard of size
8.3 reference sphere
8.4 test sphere
9 Terms relating to CMM error or error of indication
9.1 error of indication of a CMM for size measurement
9.2 maximum permissible error of indication of a CMM for size measurement
9.3 probing error
9.4 maximum permissible probing error
9.5 radial four-axis error
9.6 tangential four-axis error
9.7 axial four-axis error
9.8 maximum permissible radial four-axis error
9.9 maximum permissible tangential four-axis error
9.10 maximum permissible axial four-axis error
9.12 maximum permissible scanning probing error
9.13 time for scanning test
9.14 maximum permissible time for scanning test
9.15 fixed multiple-stylus probing system form error
9.16 fixed multiple-stylus probing system size error
9.17 fixed multiple-stylus probing system location error
9.18 maximum permissible fixed multiple-stylus probing system form error
9.19 maximum permissible fixed multiple-stylus probing system size error
9.20 maximum permissible fixed multiple-stylus probing system location error
9.21 articulated probing system form error
9.22 articulated probing system size error
9.23 articulated probing system location error
9.24 maximum permissible articulated probing system form error
9.25 maximum permissible articulated probing systém size error
9.26 maximum permissible articulated probing systém location error
10 Terms relating to features
10.1 Gaussian associated feature
11 Terms relating to software
11.1 parametrization of a feature
11.2 reference data set
11.3 reference parameter values
11.4 reference parametrization
11.5 reference residual
11.6 reference software
11.7 residual
11.8 conversion rule
11.9 converted test parameter values
11.10 test parameter values
11.11 test parametrization
11.12 test residual
11.13 extent (of a data set)
11.14 reference pair

Terminologie normy

‹

Nahlásit chybu

3.7 probing system qualification

establishment of the parameters of a probing system (2.6) necessary for subsequent measurements

3.7 kvalifikace snímacího systému

stanovení parametrů snímacího systému (2.6)

nezbytných pro následné měření