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ČSN P CEN ISO/TS 80004-6 - Nanotechnologie - Slovník - Část 6: Charakterizace nanoobjektu

Stáhnout normu:	ČSN P CEN ISO/TS 80004-6 (Zobrazit podrobnosti) Zákazníci, kteří mají na svém počítači sjednanou od České agentury pro standardizaci (ČAS) službu ČSN on-line pro elektronický přístup do plných textů norem v pdf (verzi pro firmy nebo pro jednotlivce), mohou zde přímo otevírat citované ČSN.
Datum vydání/vložení:	2016-11-01
Zdroj:	https://www.iso.org/obp/ui/#iso:std:iso:ts:80004:-6:ed-1:v1:en
Třidící znak:	012003
Obor:	Nanotechnologie
ICS:	01.040.07 - Matematika. Přírodní vědy (názvosloví) 07.120 - Nanotechnologie
Stav:	Neplatná

2.1 nanoscale
2.2 nano-object
2.3 nanoparticle
2.4 nanoplate
2.5 nanorod
2.6 nanofibre
2.7 nanotube
2.8 quantum dot
2.9 particle
2.10 agglomerate
2.11 aggregate
2.12 aerosol
2.13 suspension
3 Terms related to size and shape measurement
3.1 Terms related to measurands for size and shape
3.1.1 particle size
3.1.2 particle size distribution
3.1.3 particle shape
3.1.4 aspect ratio
3.1.5 equivalent diameter
3.2 Terms related to scattering techniques
3.2.1 radius of gyration
3.2.2 small angle neutron scattering, SANS
3.2.3 neutron diffraction
3.2.4 small angle X-ray scattering, SAXS
3.2.5 light scattering
3.2.6 hydrodynamic diameter
3.2.7 dynamic light scattering, DLS, photon correlation spectroscopy, PCS, quasi-elastic light scattering, QELS
3.2.8 nanoparticle tracking analysis, NTA, particle tracking analysis, PTA
3.3 Terms related to aerosol characterization
3.3.1 condensation particle counter, CPC
3.3.2 differential electrical mobility classifier, DEMC
3.3.3 differential mobility analysing system, DMAS
3.3.4 Faraday-cup aerosol electrometer, FCAE
3.4 Terms related to separation techniques
3.4.1 field flow fractionation, FFF
3.4.2 centrifugal liquid sedimentation, CLS, differential centrifugal sedimentation, DCS
3.4.3 size-exclusion chromatographic, SEC
3.4.4 electrical zone sensing, Coulter counter
3.5 Terms related to microscopy
3.5.1 scanning probe microscopy, SPM
3.5.2 atomic force microscopy, AFM, scanning force microscopy (deprecated), SFM (deprecated)
3.5.3 scanning tunnelling microscopy, STM
3.5.4 near-field scanning optical microscopy, NSOM, scanning near-field optical microscopy, SNOM
3.5.5 scanning electron microscopy, SEM
3.5.6 transmission electron microscopy, TEM
3.5.7 scanning transmission electron microscopy, STEM
3.5.8 low energy electron microscopy, LEEM
3.5.9 scanning ion microscopy
3.5.10 confocal optical microscopy
3.5.11 surface enhanced ellipsometric contrast microscopy, SEEC microscopy
3.5.12 fluorescence
3.5.13 fluorescence microscopy
3.5.14 total internal reflection fluorescence microscopy, TIRF microscopy
3.5.15 super-resolution microscopy
3.5.16 localization microscopy
3.6 Terms related to surface area measurement
3.6.1 mass specific surface area
3.6.2 volume specific surface area
3.6.3 Brunauer–Emmett–Teller method, BET method
4 Terms related to chemical analysis
4.1 optical spectroscopy
4.2 luminiscence (4.2)
4.3 photoluminescence
4.4 photoluminescence spectroscopy PL spectroscopy
4.5 fluorescence spectroscopy
4.6 UV–Vis spectroscopy
4.7 fluorescence correlation spectroscopy, FCS
4.8 Fourier transform infrared spectroscopy, FTIR
4.9 Raman effect
4.10 Raman spectroscopy
4.11 surface enhanced Raman spectroscopy, SERS
4.12 tip enhanced Raman spectroscopy TERS
4.13 electron spectrometer
4.14 electron energy loss spectroscopy, EELS
4.15 Auger elektron
4.16 Auger electron spectroscopy, AES
4.17 ultraviolet photoelectron spectroscopy, UPS
4.18 X-ray photoelectron spectroscopy, XPS
4.19 X-ray absorption spectroscop, XAS
4.20 X-ray fluorescence, XRF
4.21 energy-dispersive X-ray spectroscopy, EDS or EDX
4.22 inductively coupled plasma mass spectrometry, ICP-MS
4.23 secondary-ion mass spectrometry, SIMS
4.24 atom-probe tomography
4.25 evolved-gas analysis, EGA
4.26 nuclear magnetic resonance spectroscopy, NMR spectroscopy
4.27 electron paramagnetic resonance, EPR, electron spin resonance (ESR)
4.28 Mössbauer spectroscopy
4.29 dual polarization interferometry, DPI
5 Terms related to measurement of other properties
5.1 Terms related to mass measurement
5.1.1 quartz crystal microbalance, QCM
5.1.2 thermogravimetry, TG
5.1.3 differential scanning kalorimetry, DSC
5.2 Terms related to crystallinity measurement
5.2.1 X-ray diffraction
5.2.2 electron backscatter diffraction, EBSD
5.3 Terms related to charge measurement in suspensions
5.3.1 electrophoretic velocity
5.3.2 electrophoretic mobility
5.3.3 slipping plane, shear plane
5.3.4 electrokinetic potential, zeta potential
5.3.5 electric surface charge density

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ČSN P CEN ISO/TS 80004-6 - Nanotechnologie - Slovník - Část 6: Charakterizace nanoobjektu

3.2 Terms related to scattering techniques

3.2 Termíny vztahující se k technikám rozptylů